<?xml version="1.0" encoding="UTF-8"?><xml><records><record><source-app name="Biblio" version="6.x">Drupal-Biblio</source-app><ref-type>17</ref-type><contributors><authors><author><style face="normal" font="default" size="100%">Makhotkin, I. A.</style></author><author><style face="normal" font="default" size="100%">Louis, E.</style></author><author><style face="normal" font="default" size="100%">van de Kruijs, R. W. E.</style></author><author><style face="normal" font="default" size="100%">Yakshin, A. E.</style></author><author><style face="normal" font="default" size="100%">Zoethout, E.</style></author><author><style face="normal" font="default" size="100%">Seregin, A. Y.</style></author><author><style face="normal" font="default" size="100%">Tereschenko, E. Y.</style></author><author><style face="normal" font="default" size="100%">Yakunin, S. N.</style></author><author><style face="normal" font="default" size="100%">Bijkerk, F.</style></author></authors></contributors><titles><title><style face="normal" font="default" size="100%">Determination of the density of ultrathin La films in La/B(4)C layered structures using X-ray standing waves</style></title><secondary-title><style face="normal" font="default" size="100%">Physica Status Solidi a-Applications and Materials Science</style></secondary-title><alt-title><style face="normal" font="default" size="100%">Phys. Status Solidi A-Appl. Mat.</style></alt-title></titles><keywords><keyword><style  face="normal" font="default" size="100%">6.7 NM</style></keyword><keyword><style  face="normal" font="default" size="100%">BORON</style></keyword><keyword><style  face="normal" font="default" size="100%">FLUORESCENCE</style></keyword><keyword><style  face="normal" font="default" size="100%">Multilayer optics</style></keyword><keyword><style  face="normal" font="default" size="100%">RADIATION</style></keyword><keyword><style  face="normal" font="default" size="100%">REFLECTIVITY</style></keyword><keyword><style  face="normal" font="default" size="100%">thin films</style></keyword><keyword><style  face="normal" font="default" size="100%">X-ray standing waves</style></keyword></keywords><dates><year><style  face="normal" font="default" size="100%">2011</style></year><pub-dates><date><style  face="normal" font="default" size="100%">Nov</style></date></pub-dates></dates><urls><web-urls><url><style face="normal" font="default" size="100%">&lt;Go to ISI&gt;://WOS:000297514200020 </style></url></web-urls></urls><number><style face="normal" font="default" size="100%">11</style></number><volume><style face="normal" font="default" size="100%">208</style></volume><pages><style face="normal" font="default" size="100%">2597-2600</style></pages><isbn><style face="normal" font="default" size="100%">1862-6300</style></isbn><language><style face="normal" font="default" size="100%">English</style></language><abstract><style face="normal" font="default" size="100%">Using simultaneous analysis of both the grazing incidence X-ray reflectivity (GIXR) and the angular dependent fluorescence yield from ultrathin layer structures, the densities of thin La and LaN layers of 2-6 nm thickness enclosed by B(4)C layers have been determined with approximately 5% precision. The density of the La layer in these systems is found to be reduced to the bulk La value. This is explained by LaB(6) interlayers formation. The density of LaN layers were similar to the bulk LaN value, which favors this compound as the most energetically stable in LaN/B(4)C layered systems. (C) 2011 WILEY-VCH Verlag GmbH &amp; Co. KGaA, Weinheim</style></abstract><work-type><style face="normal" font="default" size="100%">Article</style></work-type><accession-num><style face="normal" font="default" size="100%">WOS:000297514200020</style></accession-num><notes><style face="normal" font="default" size="100%">ISI Document Delivery No.: 854SJTimes Cited: 0Cited Reference Count: 13</style></notes><custom1><style face="normal" font="default" size="100%">nSI</style></custom1><auth-address><style face="normal" font="default" size="100%">[Makhotkin, I. A.; Louis, E.; van de Kruijs, R. W. E.; Yakshin, A. E.; Zoethout, E.; Bijkerk, F.] FOM Inst Plasma Phys Rijnhuizen, NL-3439 MN Nieuwegein, Netherlands. [Makhotkin, I. A.; Seregin, A. Yu.; Tereschenko, E. Yu.; Yakunin, S. N.] AV Shubnikov Inst Crystallog RAS, Moscow 119333, Russia. [Yakunin, S. N.] RRC Kurchatov Inst, Moscow 123182, Russia. [Bijkerk, F.] Univ Twente, MESA, NL-7522 NB Enschede, Netherlands. [Bijkerk, F.] Univ Twente, Inst Nanotechnol, NL-7522 NB Enschede, Netherlands.Makhotkin, IA (reprint author), FOM Inst Plasma Phys Rijnhuizen, Edisonbaan 14, NL-3439 MN Nieuwegein, Netherlandsmakhotkin@rijnhuizen.nl</style></auth-address></record></records></xml>