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Sort by: Auteur Titel Type [ Jaar  (Desc)]
Filters: Auteur is Kozhevnikov, I. V.  [Clear All Filters]
2011
Kozhevnikov IV, van der Meer R, Bastiaens HMJ, Boller KJ, Bijkerk F.  2011.  Analytic theory of soft x-ray diffraction by lamellar multilayer gratings. Optics Express. 19:9172-9184. Abstract
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2010
Yakshin AE, Kozhevnikov IV, Zoethout E, Louis E, Bijkerk F.  2010.  Properties of broadband depth-graded multilayer mirrors for EUV optical systems. Optics Express. 18:6957-6971. Abstract
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de Rooij-Lohmann V, Kozhevnikov IV, Peverini L, Ziegler E, Cuerno R, Bijkerk F, Yakshin AE.  2010.  Roughness evolution of Si surfaces upon Ar ion erosion. Applied Surface Science. 256:5011-5014. Abstract
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Kozhevnikov IV, van der Meer R, Bastiaens HMJ, Boller KJ, Bijkerk F.  2010.  High-resolution, high-reflectivity operation of lamellar multilayer amplitude gratings: identification of the single-order regime. Optics Express. 18:16234-16242. Abstract
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