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2013
Sobierajski R, Jurek M, Chalupsky J, Krzywinski J, Burian T, Farahani SD, Hajkova V, Harmand M, Juha L, Klinger D et al..  2013.  Experimental set-up and procedures for the investigation of XUV free electron laser interactions with solids. Journal of Instrumentation. 8:P02010. Abstract
2012
Gaudin J, Ozkan C, Chalupsky J, Bajt S, Burian T, Vysin L, Coppola N, Farahani SD, Chapman HN, Galasso G et al..  2012.  Investigating the interaction of x-ray free electron laser radiation with grating structure. Optics Letters. 37:3033-3035. Abstract
2011
Sobierajski R, Bruijn S, Khorsand AR, Louis E, de Kruijs R, Burian T, Chalupsky J, Cihelka J, Gleeson A, Grzonka J et al..  2011.  Damage mechanisms of MoN/SiN multilayer optics for next-generation pulsed XUV light sources. Optics Express. 19:193-205. Abstract
Farahani SD, Chalupsky J, Burian T, Chapman H, Gleeson AJ, Hajkoya V, Juha L, Jurek M, Klinger D, Sinn H et al..  2011.  Damage threshold of amorphous carbon mirror for 177 eV FEL radiation. Nuclear Instruments & Methods in Physics Research Section a-Accelerators Spectrometers Detectors and Associated Equipment. 635:S39-S42. Abstract
Galtier E, Rosmej FB, Dzelzainis T, Riley D, Khattak FY, Heimann P, Lee RW, Nelson AJ, Vinko SM, Whitcher T et al..  2011.  Decay of Cystalline Order and Equilibration during the Solid-to-Plasma Transition Induced by 20-fs Microfocused 92-eV Free-Electron-Laser Pulses. Physical Review Special Topics-Accelerators and Beams. 14:4. Abstract
Galtier E, Rosmej FB, Dzelzainis T, Riley D, Khattak FY, Heimann P, Lee RW, Nelson AJ, Vinko SM, Whitcher T et al..  2011.  Decay of Cystalline Order and Equilibration during the Solid-to-Plasma Transition Induced by 20-fs Microfocused 92-eV Free-Electron-Laser Pulses. Physical Review Letters. 106:4. Abstract
2010
Vinko SM, Zastrau U, Mazevet S, Andreasson J, Bajt S, Burian T, Chalupsky J, Chapman HN, Cihelka J, Doria D et al..  2010.  Electronic Structure of an XUV Photogenerated Solid-Density Aluminum Plasma. Physical Review Letters. 104:4. Abstract
Khorsand AR, Sobierajski R, Louis E, Bruijn S, van Hattum ED, van de Kruijs RWE, Jurek M, Klinger D, Pelka JB, Juha L et al..  2010.  Single shot damage mechanism of Mo/Si multilayer optics under intense pulsed XUV-exposure. Optics Express. 18:700-712. Abstract
Chalupsky J, Krzywinski J, Juha L, Hajkova V, Cihelka J, Burian T, Vysin L, Gaudin J, Gleeson A, Jurek M et al..  2010.  Spot size characterization of focused non-Gaussian X-ray laser beams. Optics Express. 18:27836-27845. Abstract
2009
Nelson AJ, Toleikis S, Chapman H, Bajt S, Krzywinski J, Chalupsky J, Juha L, Cihelka J, Hajkova V, Vysin L et al..  2009.  Soft x-ray free electron laser microfocus for exploring matter under extreme conditions. Optics Express. 17:18271-18278. Abstract
Nagler B, Zastrau U, Faustlin RR, Vinko SM, Whitcher T, Nelson AJ, Sobierajski R, Krzywinski J, Chalupsky J, Abreu E et al..  2009.  Turning solid aluminium transparent by intense soft X-ray photoionization. Nature Physics. 5:693-696. Abstract