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2013
Sobierajski R, Jurek M, Chalupsky J, Krzywinski J, Burian T, Farahani SD, Hajkova V, Harmand M, Juha L, Klinger D et al..  2013.  Experimental set-up and procedures for the investigation of XUV free electron laser interactions with solids. Journal of Instrumentation. 8:P02010. Abstract
2012
Gaudin J, Peyrusse O, Chalupsky J, Toufarova M, Vysin L, Hajkova V, Sobierajski R, Burian T, Dastjani-Farahani S, Graf A et al..  2012.  Amorphous to crystalline phase transition in carbon induced by intense femtosecond x-ray free-electron laser pulses. Physical Review B. 86:7. Abstract
Gaudin J, Ozkan C, Chalupsky J, Bajt S, Burian T, Vysin L, Coppola N, Farahani SD, Chapman HN, Galasso G et al..  2012.  Investigating the interaction of x-ray free electron laser radiation with grating structure. Optics Letters. 37:3033-3035. Abstract
2011
Sobierajski R, Bruijn S, Khorsand AR, Louis E, de Kruijs R, Burian T, Chalupsky J, Cihelka J, Gleeson A, Grzonka J et al..  2011.  Damage mechanisms of MoN/SiN multilayer optics for next-generation pulsed XUV light sources. Optics Express. 19:193-205. Abstract
Andreasson J, Iwan B, Andrejczuk A, Abreu E, Bergh M, Caleman C, Nelson AJ, Bajt S, Chalupsky J, Chapman HN et al..  2011.  Saturated ablation in metal hydrides and acceleration of protons and deuterons to keV energies with a soft-x-ray laser. Physical Review E. 83:7. Abstract
Iwan B, Andreasson J, Andrejczuk A, Abreu E, Bergh M, Caleman C, Nelson AJ, Bajt S, Chalupsky J, Chapman HN et al..  2011.  TOF-OFF: A method for determining focal positions in tightly focused free-electron laser experiments by measurement of ejected ions. High Energy Density Physics. 7:336-342. Abstract
Farahani SD, Chalupsky J, Burian T, Chapman H, Gleeson AJ, Hajkoya V, Juha L, Jurek M, Klinger D, Sinn H et al..  2011.  Damage threshold of amorphous carbon mirror for 177 eV FEL radiation. Nuclear Instruments & Methods in Physics Research Section a-Accelerators Spectrometers Detectors and Associated Equipment. 635:S39-S42. Abstract
Galtier E, Rosmej FB, Dzelzainis T, Riley D, Khattak FY, Heimann P, Lee RW, Nelson AJ, Vinko SM, Whitcher T et al..  2011.  Decay of Cystalline Order and Equilibration during the Solid-to-Plasma Transition Induced by 20-fs Microfocused 92-eV Free-Electron-Laser Pulses. Physical Review Special Topics-Accelerators and Beams. 14:4. Abstract
Galtier E, Rosmej FB, Dzelzainis T, Riley D, Khattak FY, Heimann P, Lee RW, Nelson AJ, Vinko SM, Whitcher T et al..  2011.  Decay of Cystalline Order and Equilibration during the Solid-to-Plasma Transition Induced by 20-fs Microfocused 92-eV Free-Electron-Laser Pulses. Physical Review Letters. 106:4. Abstract
2010
Hau-Riege SP, London RA, Graf A, Baker SL, Soufli R, Sobierajski R, Burian T, Chalupsky J, Juha L, Gaudin J et al..  2010.  Interaction of short x-ray pulses with low-Z x-ray optics materials at the LCLS free-electron laser. Optics Express. 18:23933-23938. Abstract
Vinko SM, Zastrau U, Mazevet S, Andreasson J, Bajt S, Burian T, Chalupsky J, Chapman HN, Cihelka J, Doria D et al..  2010.  Electronic Structure of an XUV Photogenerated Solid-Density Aluminum Plasma. Physical Review Letters. 104:4. Abstract
Khorsand AR, Sobierajski R, Louis E, Bruijn S, van Hattum ED, van de Kruijs RWE, Jurek M, Klinger D, Pelka JB, Juha L et al..  2010.  Single shot damage mechanism of Mo/Si multilayer optics under intense pulsed XUV-exposure. Optics Express. 18:700-712. Abstract
Chalupsky J, Krzywinski J, Juha L, Hajkova V, Cihelka J, Burian T, Vysin L, Gaudin J, Gleeson A, Jurek M et al..  2010.  Spot size characterization of focused non-Gaussian X-ray laser beams. Optics Express. 18:27836-27845. Abstract
2009
Nelson AJ, Toleikis S, Chapman H, Bajt S, Krzywinski J, Chalupsky J, Juha L, Cihelka J, Hajkova V, Vysin L et al..  2009.  Soft x-ray free electron laser microfocus for exploring matter under extreme conditions. Optics Express. 17:18271-18278. Abstract
Nagler B, Zastrau U, Faustlin RR, Vinko SM, Whitcher T, Nelson AJ, Sobierajski R, Krzywinski J, Chalupsky J, Abreu E et al..  2009.  Turning solid aluminium transparent by intense soft X-ray photoionization. Nature Physics. 5:693-696. Abstract