Filters: Auteur is Louis, E. [Clear All Filters]
Mo/Si multilayer-coated amplitude-division beam splitters for XUV radiation sources. Journal of Synchrotron Radiation. 20:249-257.. 2013.
Spectral properties of La/B - based multilayer mirrors near the boron K absorption edge. Optics Express. 20:11778-11786.. 2012.
Ellipsometry with randomly varying polarization states. Optics Express. 20:870-878.. 2012.
Wavelength separation from extreme ultraviolet mirrors using phaseshift reflection. Optics Letters. 37:160-162.. 2012.
Influence of noble gas ion polishing species on extreme ultraviolet mirrors. Journal of Applied Physics. 112. 2012.
Modelling single shot damage thresholds of multilayer optics for high-intensity short-wavelength radiation sources. Optics Express. 20:28200-28215.. 2012.
Physics and technology development of multilayer EUV reflective optics. Universiteit Twente, faculteit Technische Natuurwetenschappen. PhD. 2012.
Characterization of Mo/Si multilayer growth on stepped topographies. Journal of Vacuum Science & Technology B. 29:6.. 2011.
Carbon-induced extreme ultraviolet reflectance loss characterized using visible-light ellipsometry. Measurement Science & Technology. 22:8.. 2011.
In situ ellipsometry study of atomic hydrogen etching of extreme ultraviolet induced carbon layers. Applied Surface Science. 258:7-12.. 2011.
Nanometer interface and materials control for multilayer EUV-optical applications. Progress in Surface Science. 86:255-294.. 2011.
Determination of the density of ultrathin La films in La/B(4)C layered structures using X-ray standing waves. Physica Status Solidi a-Applications and Materials Science. 208:2597-2600.. 2011.
Damage mechanisms of MoN/SiN multilayer optics for next-generation pulsed XUV light sources. Optics Express. 19:193-205.. 2011.
Nitridation and contrast of B4C/La interfaces and X-ray multilayer optics. Thin Solid Films. 518:7249-7252.. 2010.
Secondary electron yield measurements of carbon covered multilayer optics. Applied Surface Science. 257:354-361.. 2010.
Formation of Si/SiC multilayers by low-energy ion implantation and thermal annealing. Nuclear Instruments & Methods in Physics Research Section B-Beam Interactions with Materials and Atoms. 268:560-567.. 2010.
Properties of broadband depth-graded multilayer mirrors for EUV optical systems. Optics Express. 18:6957-6971.. 2010.
Surface morphology of Kr+-polished amorphous Si layers. Journal of Vacuum Science & Technology A. 28:552-558.. 2010.