] Filters: Auteur is Louis, E. [Clear All Filters]
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2013. Mo/Si multilayer-coated amplitude-division beam splitters for XUV radiation sources. Journal of Synchrotron Radiation. 20:249-257. Abstract
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2012. Spectral properties of La/B - based multilayer mirrors near the boron K absorption edge. Optics Express. 20:11778-11786. Abstract
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2012. Ellipsometry with randomly varying polarization states. Optics Express. 20:870-878. Abstract
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2012. Wavelength separation from extreme ultraviolet mirrors using phaseshift reflection. Optics Letters. 37:160-162. Abstract
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2012. Influence of noble gas ion polishing species on extreme ultraviolet mirrors. Journal of Applied Physics. 112 Abstract
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2012. Modelling single shot damage thresholds of multilayer optics for high-intensity short-wavelength radiation sources. Optics Express. 20:28200-28215. Abstract
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2012. Physics and technology development of multilayer EUV reflective optics. Universiteit Twente, faculteit Technische Natuurwetenschappen. PhD
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2011. Characterization of Mo/Si multilayer growth on stepped topographies. Journal of Vacuum Science & Technology B. 29:6. Abstract
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2011. Phase characterization of the reflection on an extreme UV multilayer: comparison between attosecond metrology and standing wave measurements. Optics Letters. 36:3386-3388. Abstract
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2011. Carbon-induced extreme ultraviolet reflectance loss characterized using visible-light ellipsometry. Measurement Science & Technology. 22:8. Abstract
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2011. In situ ellipsometry study of atomic hydrogen etching of extreme ultraviolet induced carbon layers. Applied Surface Science. 258:7-12. Abstract
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2011. Nanometer interface and materials control for multilayer EUV-optical applications. Progress in Surface Science. 86:255-294. Abstract
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2011. Determination of the density of ultrathin La films in La/B(4)C layered structures using X-ray standing waves. Physica Status Solidi a-Applications and Materials Science. 208:2597-2600. Abstract
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2011. Angle-resolved photoelectron spectroscopy of sequential three-photon triple ionization of neon at 90.5 eV photon energy. Physical Review A. 83:4. Abstract
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2011. Damage mechanisms of MoN/SiN multilayer optics for next-generation pulsed XUV light sources. Optics Express. 19:193-205. Abstract
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2010. Nitridation and contrast of B4C/La interfaces and X-ray multilayer optics. Thin Solid Films. 518:7249-7252. Abstract
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2010. Secondary electron yield measurements of carbon covered multilayer optics. Applied Surface Science. 257:354-361. Abstract
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2010. Formation of Si/SiC multilayers by low-energy ion implantation and thermal annealing. Nuclear Instruments & Methods in Physics Research Section B-Beam Interactions with Materials and Atoms. 268:560-567. Abstract
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2010. Properties of broadband depth-graded multilayer mirrors for EUV optical systems. Optics Express. 18:6957-6971. Abstract
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2010. Surface morphology of Kr+-polished amorphous Si layers. Journal of Vacuum Science & Technology A. 28:552-558. Abstract